University of Bremen (IALB)
The IALB is a research institute of the University of Bremen. Its device group involved in iRel4.0 investigates alternative semiconductor materials (SiC, GaN, Ga2O3, diamond), material basics, device concepts, modelling, packaging, cooling, reliability, influence of parasitics, and EMC.
The 1994 founded IALB (Institute for Electrical Drivers, Power Electronics, and Devices) is a non-profit research institute of the University of Bremen and is involved in various national, European, and industrial research and development projects. Its device group involved in iRel4.0 investigates alternative semiconductor materials (SiC, GaN, Ga2O3, diamond), material basics, device concepts, modelling, packaging, cooling, reliability, influence of parasitics, and EMC, as well as the interaction between devices and circuitry, e.g. in resonant applications or under SOA conditions.
The device group owns a variety of test benches for the characterisation of power semiconductor devices and their long-term reliability testing. The IALB is an established partner of the industry to perform robustness and reliability tests on IGBTs and wide band-gap devices and is internationally recognised for the contributions to the field of power semiconductor devices, especially to device concepts, parasitics, robustness and reliability.
The IALB will perform reliability tests with corrosive gases (H2S and other gases), humidity, temperature and bias on high power modules. The accelerated testing of materials and modules will be used to determine a reproducible dependence between the degradation mechanisms and the applied conditions. Based on this data, a lifetime model will be established with respect to temperature, humidity, bias and gas concentration.
In a later phase of the project, coatings and different package materials will be investigated, which are supposed to retard if not avoid corrosion even under harsh conditions. For this task, multiple tests will be carried out on a variety of samples to assess the performance of different approaches. The results from other partners will be included to support the lifetime model and improve its significance.
The IALB will perform a variety of reliability tests focused on the device performance in humid and also corrosive gas environment. The test set ups allow for a wide range of test parameters like high bias, humidity level and concentration of corrosive gases, mainly H2S. Based on this data, a lifetime model will be established, which takes into account the main acceleration factors and which can be used to estimate the lifetime under a given mission profile of a certain application.
Furthermore, the failure analysis of the failed devices will contribute to a better understanding of the relevant mechanisms and their prevention. Finally, the knowledge will be utilised to assess coatings and alternative packaging materials regarding their effectiveness to retard of even avoid corrosion.