Nanodesign l.t.d. was established in 2007 as a spin-off company of the Slovak University of Technology in Bratislava, Faculty of Electrical Engineering and Information Technology. Our company is focused on research and development in the field of electronic devices and systems. The main research activity is aimed at the design of power electronics devices and IoT systems with special attention on SMART sensors. Furthermore, we put effort into the development of new technologies suitable for novel electronic materials, devices, and circuits. As a result, we are established as professionals in the field of SMART systems development as well as their implementation on the market.
NanoDesign is a spin-off company, founded in 2007 by a group of specialists in field of precise measurement in bioelectronics. Today it is research and development company composed of 7 full-time research workers strengthened yearly by extra 3-4 master and PhD degree students.
Several research projects are being resolved yearly, mostly in field of design of precise measurement devices, measurement modules for testing and characterization. High precision bioelectronics devices and measurement test stations were developed. The measurement devices (TDR, UIS) facilitate selective research tasks in EU projects with focus on new devices and technologies (GaN, Si).
NanoDesign (SME) will develop a dedicated a tester unified test bench enabling for characterisation of double-pulse switching, including diode reverse-recovery (RR), short-circuit (SC), unclamped inductive switching and avalanche breakdown capability (UIS). A test equipment and all parasitic inductances and capacitances to allow wafer level testing will be optimized as well. Further methodology for accelerated multipulse (SC/UIS/HSW) testing will be developed to become part of the production line based on Quality 4.0.
Nano will contribute to reliability testing by development of new tester as a part of the Quality 4.0 with focus on existing and new testing methods. Main tasks in design of experimental tester for hard switching and UIS testing is to prolong the useful life of the power devices and delay the wear out of the by studying of impact of repetitive hard switching and UIS on performance and eventually on degradation of power devices with objective to provide new reliability test methods for manufacturing production lines.