Journal Articles & Books
de la Rosa, Francisco López, José L. Gómez-Sirvent, Roberto Sánchez-Reolid, Rafael Morales, and Antonio Fernández-Caballero.
Expert Systems with Applications (2022): 117731.
Hagara, Miroslav, Radovan Stojanović, Alexander Šatka, Peter Kubinec, and Oldřich Ondráček.
Modified algorithm of unimodal thresholding for FPGA implementation
Microprocessors and Microsystems 94 (2022): 104669.
López de la Rosa, Francisco, Roberto Sánchez-Reolid, José L. Gómez-Sirvent, Rafael Morales, and Antonio Fernández-Caballero.
Applied Sciences 11, no. 20 (2021): 9508.
Modolo, N., C. De Santi, G. Baratella, A. Bettini, M. Borga, N. Posthuma, B. Bakeroot et al.
Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices
IEEE Transactions on Electron Devices 69, no. 8 (2022): 4432-4437.
de la Rosa, Francisco López, José L. Gómez-Sirvent, Rafael Morales, Roberto Sánchez-Reolid, and Antonio Fernández-Caballero.
Applied Soft Computing (2022): 109743.
Millesimo, M., C. Fiegna, N. Posthuma, M. Borga, B. Bakeroot, S. Decoutere, and A. N. Tallarico
High-Temperature Time-Dependent Gate Breakdown of p-GaN HEMTs
IEEE Transactions on Electron Devices 68, no. 11 (2021): 5701-5706
Olschewski, Thomas.
Fast Accurate Defect Detection in Wafer Fabrication
arXiv preprint arXiv:2108.11757 (2021)
Olschewski, Thomas
Defect Detection on Semiconductor Wafers by Distribution Analysis
arXiv preprint arXiv:2111.03727 (2021)
Safari, Leila, Gianluca Barile, Vincenzo Stornelli, Shahram Minaei, and Giuseppe Ferri
Towards Realization of a Low-Voltage Class-AB VCII with High Current Drive Capability
Electronics 10, no. 18 (2021): 2303
Van Driel, Willem D., B. Jacobs, P. Watte, and X. Zhao
Reliability of LED-based systems
Microelectronics Reliability 129 (2022): 114477
Tallarico, A. N., M. Millesimo, B. Bakeroot, M. Borga, N. Posthuma, S. Decoutere, E. Sangiorgi, and C. Fiegna
IEEE Transactions on Electron Devices 69, no. 2 (2021): 507-513
Meneghini, Matteo, Carlo De Santi, Idriss Abid, Matteo Buffolo, Marcello Cioni, Riyaz Abdul Khadar, Luca Nela et al
GaN-based power devices: Physics, reliability, and perspectives
Journal of Applied Physics 130, no. 18 (2021): 181101
Bonet, F., O. Aviñó-Salvadó, M. Vellvehi, X. Jordà, P. Godignon, and X. Perpiñà
Carrier Concentration Analysis in 1.2 kV SiC Schottky Diodes under Current Crowding
IEEE Electron Device Letters (2022) (Early Access)
Book chapter:
van Driel, W. D., B. J. C. Jacobs, G. Onushkin, P. Watte, X. Zhao, and J. Lynn Davis
Reliability and Failures in Solid State Lighting Systems
In Reliability of Organic Compounds in Microelectronics and Optoelectronics, pp. 211-240. Springer, 2022.
Book chapter:
van Driel, W. D., M. Yazdan Mehr, X. J. Fan, and G. Q. Zhang
Outlook: From Physics of Failure to Physics of Degradation
In Reliability of Organic Compounds in Microelectronics and Optoelectronics, pp. 535-538. Springer, 2022.
Book chapter:
Ross, R., and Koopmans, G.
Reliability and Degradation of Power Electronic Materials
In Reliability of Organic Compounds in Microelectronics and Optoelectronics, pp. 449-478. Springer, 2022.