Journal Articles & Books

Millesimo, M., C. Fiegna, N. Posthuma, M. Borga, B. Bakeroot, S. Decoutere, and A. N. Tallarico

High-Temperature Time-Dependent Gate Breakdown of p-GaN HEMTs

IEEE Transactions on Electron Devices 68, no. 11 (2021): 5701-5706

Olschewski, Thomas.

Fast Accurate Defect Detection in Wafer Fabrication

arXiv preprint arXiv:2108.11757 (2021)

Alagić, Dženana, and Jürgen Pilz

A Clustering Based Image Segmentation Procedure to Automatically Detect Grains in Polycrystalline Materials

Research Square 2020,  https://doi.org/10.21203/rs.3.rs-112115/v1

Tallarico, A. N., M. Millesimo, B. Bakeroot, M. Borga, N. Posthuma, S. Decoutere, E. Sangiorgi, and C. Fiegna

TCAD Modeling of the Dynamic V TH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs

IEEE Transactions on Electron Devices 69, no. 2 (2021): 507-513

Olschewski, Thomas

Defect Detection on Semiconductor Wafers by Distribution Analysis

arXiv preprint arXiv:2111.03727 (2021)

Safari, Leila, Gianluca Barile, Vincenzo Stornelli, Shahram Minaei, and Giuseppe Ferri

Towards Realization of a Low-Voltage Class-AB VCII with High Current Drive Capability

Electronics 10, no. 18 (2021): 2303

Van Driel, Willem D., B. Jacobs, P. Watte, and X. Zhao

Reliability of LED-based systems

Microelectronics Reliability 129 (2022): 114477

Tallarico, A. N., M. Millesimo, B. Bakeroot, M. Borga, N. Posthuma, S. Decoutere, E. Sangiorgi, and C. Fiegna

TCAD Modeling of the Dynamic V TH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs

IEEE Transactions on Electron Devices 69, no. 2 (2021): 507-513

Meneghini, Matteo, Carlo De Santi, Idriss Abid, Matteo Buffolo, Marcello Cioni, Riyaz Abdul Khadar, Luca Nela et al

GaN-based power devices: Physics, reliability, and perspectives

Journal of Applied Physics 130, no. 18 (2021): 181101

Bonet, F., O. Aviñó-Salvadó, M. Vellvehi, X. Jordà, P. Godignon, and X. Perpiñà

Carrier Concentration Analysis in 1.2 kV SiC Schottky Diodes under Current Crowding

IEEE Electron Device Letters (2022) (Early Access)

Book chapter:

van Driel, W. D., B. J. C. Jacobs, G. Onushkin, P. Watte, X. Zhao, and J. Lynn Davis

Reliability and Failures in Solid State Lighting Systems

In Reliability of Organic Compounds in Microelectronics and Optoelectronics, pp. 211-240. Springer, 2022.

Book chapter:

van Driel, W. D., M. Yazdan Mehr, X. J. Fan, and G. Q. Zhang

Outlook: From Physics of Failure to Physics of Degradation

In Reliability of Organic Compounds in Microelectronics and Optoelectronics, pp. 211-240. Springer, 2022.