de la Rosa, Francisco López, José L. Gómez-Sirvent, Roberto Sánchez-Reolid, Rafael Morales, and Antonio Fernández-Caballero.

Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network

Expert Systems with Applications (2022): 117731.

Hagara, Miroslav, Radovan Stojanović, Alexander Šatka, Peter Kubinec, and Oldřich Ondráček.

Modified algorithm of unimodal thresholding for FPGA implementation

Microprocessors and Microsystems 94 (2022): 104669.

López de la Rosa, Francisco, Roberto Sánchez-Reolid, José L. Gómez-Sirvent, Rafael Morales, and Antonio Fernández-Caballero.

A review on machine and deep learning for semiconductor defect classification in scanning electron microscope images

Applied Sciences 11, no. 20 (2021): 9508.

Modolo, N., C. De Santi, G. Baratella, A. Bettini, M. Borga, N. Posthuma, B. Bakeroot et al.

Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices

IEEE Transactions on Electron Devices 69, no. 8 (2022): 4432-4437.

de la Rosa, Francisco López, José L. Gómez-Sirvent, Rafael Morales, Roberto Sánchez-Reolid, and Antonio Fernández-Caballero.

A deep residual neural network for semiconductor defect classification in imbalanced scanning electron microscope datasets

Applied Soft Computing (2022): 109743.

Millesimo, M., C. Fiegna, N. Posthuma, M. Borga, B. Bakeroot, S. Decoutere, and A. N. Tallarico

High-Temperature Time-Dependent Gate Breakdown of p-GaN HEMTs

IEEE Transactions on Electron Devices 68, no. 11 (2021): 5701-5706

Olschewski, Thomas.

Fast Accurate Defect Detection in Wafer Fabrication

arXiv preprint arXiv:2108.11757 (2021)

Olschewski, Thomas

Defect Detection on Semiconductor Wafers by Distribution Analysis

arXiv preprint arXiv:2111.03727 (2021)

Safari, Leila, Gianluca Barile, Vincenzo Stornelli, Shahram Minaei, and Giuseppe Ferri

Towards Realization of a Low-Voltage Class-AB VCII with High Current Drive Capability

Electronics 10, no. 18 (2021): 2303

Van Driel, Willem D., B. Jacobs, P. Watte, and X. Zhao

Reliability of LED-based systems

Microelectronics Reliability 129 (2022): 114477

Tallarico, A. N., M. Millesimo, B. Bakeroot, M. Borga, N. Posthuma, S. Decoutere, E. Sangiorgi, and C. Fiegna

TCAD Modeling of the Dynamic V TH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs

IEEE Transactions on Electron Devices 69, no. 2 (2021): 507-513

Meneghini, Matteo, Carlo De Santi, Idriss Abid, Matteo Buffolo, Marcello Cioni, Riyaz Abdul Khadar, Luca Nela et al

GaN-based power devices: Physics, reliability, and perspectives

Journal of Applied Physics 130, no. 18 (2021): 181101

Bonet, F., O. Aviñó-Salvadó, M. Vellvehi, X. Jordà, P. Godignon, and X. Perpiñà

Carrier Concentration Analysis in 1.2 kV SiC Schottky Diodes under Current Crowding

IEEE Electron Device Letters (2022) (Early Access)

Book chapter:

van Driel, W. D., B. J. C. Jacobs, G. Onushkin, P. Watte, X. Zhao, and J. Lynn Davis

Reliability and Failures in Solid State Lighting Systems

In Reliability of Organic Compounds in Microelectronics and Optoelectronics, pp. 211-240. Springer, 2022.

Book chapter:

van Driel, W. D., M. Yazdan Mehr, X. J. Fan, and G. Q. Zhang

Outlook: From Physics of Failure to Physics of Degradation

In Reliability of Organic Compounds in Microelectronics and Optoelectronics, pp. 535-538. Springer, 2022.