Conference Contributions

Van Driel, W.D. - Jacobs, B.J.C. - Watte, P. - Zhao, X.

Reliability of LED-based Systems

Conference International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)

6-27.07.2020 (online event)

Baraldi, P. - Medici, S. - Ahmed, I. - Zio, E. - Lewitschnig, H.

A Method Based on Gaussian Process Regression for Modelling Burn-in of Semiconductor Devices

31st European Safety and Reliability Conference

19-23.09.2021, Angers, France (hybrid event)

Marek, J. - Kozárik, J. - Chvála, A. - Minárik, M. - Donoval, M.

Power SIC MOSFET Under Repetitive UIS and Short Circuit Stress

Advances in Electronic and Photonic Technologies (ADEPT 2021)

20-23.09.2021, Podbanské, Slovakia