Corinna Kofler,  Claudia Anna Dohr, Judith Dohr, Anja Zernig

Data-centric model development to improve the CNN classification of defect density SEM images

48th Annual Conference of the Industrial Electronics Society IECON 2022 Conference

October 17 - 20, 2022, Brussels, Belgium

Mustafa Onur Izmitlioglu, Mujdat Soyturk           

A Practical Study on Optimization of Big Data Streaming and Data Analytics Infrastructure for Efficient AI-Based Processing         

24th International Microwave and Radar Conference (MIKON 2022)

12-14 September 2022, Warsaw, Poland

Miroslav Hagara, Peter Kubinec, Alexander Šatka, Radovan Stojanović

FPGA implementation of histogram-based thresholding.           

11th Mediterranean Conference on Embedded Computing (MECO)

June 7-10, 2022, Budva, Montenegro,

L.Du, X.Zhao, P.Watte, R.Poelma, W.v.Driel, G.Zhang      

Investigation of Potting Compounds on Thermal-Fatigue properties of Solder Interconnects      

48th Annual Conference of the Industrial Electronics Society IECON 2022 Conference

October 17 - 20, 2022, Brussels, Belgium

Kutalmış Coşkun, Zeynep Kumralbaş, Hazel Çavuş, Borahan Tümer            

A Syntactic Pattern Recognition based Approach to Online Anomaly Detection and Identification on Electric Motors               

The German Conference on Pattern Recognition (GCPR)

Tue 27. – Fri 30. September, Konstanz, Germany

Jose Luis de la Vara; Thomas Bauer; Bernhard Fischer; Mustafa Karaca; Henrique Madeira; Martin Matschnig; Silvia Mazzini; Giann Spilere Nandi; Fabio Patrone; David Pereira; José Proença; Rupert Schlick; Stefano Tonetta; Ugur Yayan; Behrooz Sangchoolie     

A Proposal for the Classification of Methods for Verification and Validation of Safety, Cybersecurity, and Privacy of Automated Systems      

Quality of Information and Communications Technology (QUATIC 2021) & Communications in Computer and Information Science

September 8-10, 2021 (online)

Rok Hribar, Gašper Petelin, Margarita Antoniou, Anton Biasizzo, Stanko Ciglarič, Gregor Papa      

On Suitability of the Customized Measuring Device for Electric Motor

48th Annual Conference of the Industrial Electronics Society IECON 2022 Conference      

October 17 - 20, 2022, Brussels, Belgium

Kutalmıs Coskun, Onur Izmitlioglu, Mujdat Soyturk, Borahan Tumer, Deniz Gunes¸ Sinan Saracoglu, Baris Bulut, Burak Ketmen, Ismethan Hanedar, Tasdemir Asan, Eray Aydın, Ahmet Hamdi Levent     

An AI-based architecture framework for improving end of line reliability tests of electric motors             

48th Annual Conference of the Industrial Electronics Society IECON 2022 Conference

October 17 - 20, 2022, Brussels, Belgium

Francisco L´opez de la Rosa , Jos´e L. G´omez-Sirvent , Corinna Kofler , Rafael Morales, Antonio Fernandez-Caballero

Detection of Unknown Defects in Semiconductor Materials From a Hybrid Deep and Machine Learning Approach               

9th International Work-Conference on the Interplay between Natural and Artificial Computation (IWINAC 2022) & Lecture Notes in Computer Science

Jun 03, 2022 - Jun 03, 2022 Tenerife , Spain

A. Bettini , T. Cosnier, A. Magnani, O. Syshchyk, M. Borga, S. Decoutere, A. Neviani

Analysis and Design of a Fully-Integrated Pulsed LiDAR Driver in 100V-GaN IC Technology

17th International Conference on PhD Research in Microelectronics and Electronics (PRIME 2022)

12-16 June 2022, Tanka Village, Villasimius (Ca) Italy

F. Chiocchetta, C. De Santi, F. Rampazzo, K. Mukherjee, Jan Grünenpütt, Daniel Sommer, Hervé Blanck, Benoit Lambert, A. Gerosa, G. Meneghesso, E. Zanoni , M. Meneghini

Study of the Influence of Gate Etching and Passivation on Current Dispersion, Trapping and Reliability in RF 0.15 µm GaN HEMTs       

33rd European Symposium on Reliability of Electron Devices Failure Physics and Analysis (ESREF2022)      

September 26-29, 2022 Berlin, Germany

C. Lai, P. Baraldi,  I. Ahmed, E. Zio, A. Del Cueto, Javier Gil, Sergio Llorente

Monitoring Degradation of Insulated Gate Bipolar Transistors in Induction Cooktops by Artificial Neural Networks               

32nd European Safety and Reliability Conference (ESREL2022)

28th August – 1st September 2022 Dublin, Ireland

F. Hosseinpour, I. Ahmed, P. Baraldi, M. Behzad, E. Zio, H. Lewitschnig

An Unsupervised Method for Fault Detection in Multi-Stage Production Systems Based on LSTM Autoencoders

32nd European Safety and Reliability Conference (ESREL2022)

28th August – 1st September 2022 Dublin, Ireland

Modolo, Nicola; Fregolent, Manuel; Masin, Fabrizio; Benato, Andrea; Bettini, Andrea; Buffolo, Matteo; De Santi, Carlo; Borga, Matteo; Posthuma, Niels; Bakeroot, Benoit; Decoutere, Stefaan; Vogrig, Daniele; Neviani, Andrea; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo

Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs

33rd European Symposium on Reliability of Electron Devices Failure Physics and Analysis

September 26-29, 2022 Berlin, Germany

P. Baraldi, S. Medici, I. Ahmed, E. Zio, H. Lewitschnig

A Method Based on Gaussian Process Regression for Modelling Burn-in of Semiconductor Devices

31st European Safety and Reliability Conference

19-23.09.2021, Angers, France (hybrid event)

J. Marek, J. Kozárik, A. Chvála, M. Minárik and M. Donoval

Degradation Of Power Sic Mosfet Under Repetitive Uis And Short Circuit Stress

The 15th International Seminar on Power Semiconductors (ISPS 2021)

25 August - 27 August 2021, Prague, Czech Republic

P. Watté, G. van Hees, R. Engelen, W.D van Driel

Reliability of Electronic Drivers: An Industrial Approach

ASME 2021 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems

October 25 – 27, 2022 Hyatt Regency Orange County, Garden Grove, CA

P. Sanaa, A. Graffa, S. Hübnera, M. Simone-Najaseka, V. Zhan Gaob, F. Rampazzob, B. Lambertc, G. Meneghessob, E. Zanonib, M. Meneghinib and F. Altmanna

Microstructural Degradation Investigations of OFF-State Stressed 0.15 µm RF AlGaN/GaN HEMTs: Failure Mode related Breakdown

WiPDA, the IEEE Wide Bandgap Power Devices and Applications workshop

November 7-9, 2021, Redondo Beach, California

K. Pressel, J. Moser, S. Rzepka, K. Brinkfeldt, S. Zhao, W. van Driel, P. Giammatteo, B. Bulut, Soyturk, L. Pomante

The H2020-ECSEL Project” iRel40” (Intelligent Reliability 4.0)

DSD 2021

September 1-3, 2021, Palermo, Italy

L. Hahne, F.A. Velarde G., A. Lange, Chr. Sohrmann, D. Wetzel, S. Crocoll

ReliaVision: In-circuit transistor reliability investigation using XML-based technology reliability information in PDKs

IEEE International Integrated Reliability Workshop (IIRW)

October 2021, (online)

W.D. Van Driel, B.J.C. Jacobs, P. Watte, X. Zhao,

Reliability of LED-based Systems

International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)

6-27.07.2020 (online event)

P. Watté, G. van Hees, R. Engelen, W.D van Driel

Reliability of electronic drivers: An industrial approach

ASME 2021 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems,
InterPACK2021

October 26-28, 2021, (online)

M. Hashemi, M. A. Golkani, D. Watzenig

A Robust Approach for Inter-Turn Fault Detection of PMSM Used for Autonomous Vehicles

International Conference on Connected Vehicles and Expo

February 21-23, 2022, Florida, USA

J. Marek, J. Kozárik, A. Chvála, M. Minárik, M.Donoval

Power SIC MOSFET Under Repetitive UIS and Short Circuit Stress

Advances in Electronic and Photonic Technologies (ADEPT 2021)

20-23.09.2021, Podbanské, Slovakia

S. Grubmueller, P. Innerwinkler

A Framework for the Determination of realistic Usage Profiles for Automated Shuttle Pods

IEEE International Conference on Connected Vehicles and Expo 2022

March 7-9, 2022, Florida, USA

J. Zündel, M. Sagerer, M. Frewein, T. Krivec

Characterization of prepreg shrinkage and investigation of its influence on warpage simulation

EuroSimE Conference 2021

July 6 - 8, 2021,  (online)

M. Frewein, S. Stojanovic, Q. Tao, T. Krivec, J. Zuendel, M. Goessler, P. F. Fuchs, M. Gschwandl

An advanced, systematic simulation approach for studying warpage drivers of an assembled printed circuit board in early development stage

EuroSimE Conference 2022

April 24 - 27, 2022, Malta

F. Chiocchetta, C. De Santi, F. Rampazzo, K. Mukherjee, Jan Grünenpütt, Daniel Sommer, Hervé Blanck, Benoit Lambert, G. Meneghesso, E. Zanoni, and M. Meneghini

GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse

International Reliability Physics Symposium 2022

March 27-31, 2022, Dallas, Texas

M. Millesimo, B. Bakeroot, M. Borga, N. Posthuma, S. Decoutere, E. Sangiorgi, C. Fiegna, and A. N. Tallarico

Gate Reliability of p-GaN Power HEMTs Under Pulsed Stress Condition

2022 IEEE International Reliability Physics Symposium (IRPS)

March 27-31, 2022, Dallas, TX, USA

T. Krivec

Virtual Assessement of Power Packages

8th European Expert Workshop on Reliability of Electronics and Smart Systems

October 22, 2020, (online)

D. Kostynski, S. Sack, M. Sievers

Active Thermal Cycling of Discrete Power Semiconductors for Applications with strong ∆T-Profiles

12th International Conference on Integrated Power Electronics Systems

March 18-20, 2022, Berlin, Germany

B.S.Çağlar, H.B.Ketmen, B. Bulut

Anomaly Detection using Audio Signals

International Aegean Scientific Research Symposium 2021

December 25-26, 2021, (online)

T.Happonen, A.Korhonen, P.Järvinen, M.Turunen, T. Liimatta, M. Paakkolanvaara, and T.Alajoki

Roll-to-roll manufacturing and reliability assessment of stretchable temperature sensors

LOPEC 2022

March 23–24, 2022, München, Germany

R. Dudek, R. Döring, A. Mathew, A. Otto, S. Rzepka

Modelling Thermal Fatigue in Power Electronics

EuroSimE 2022

April 25 – 27, 2022, Malta