Conference Contributions
Van Driel, W.D. - Jacobs, B.J.C. - Watte, P. - Zhao, X.
Reliability of LED-based Systems
Conference International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
6-27.07.2020 (online event)
Baraldi, P. - Medici, S. - Ahmed, I. - Zio, E. - Lewitschnig, H.
A Method Based on Gaussian Process Regression for Modelling Burn-in of Semiconductor Devices
31st European Safety and Reliability Conference
19-23.09.2021, Angers, France (hybrid event)
Marek, J. - Kozárik, J. - Chvála, A. - Minárik, M. - Donoval, M.
Power SIC MOSFET Under Repetitive UIS and Short Circuit Stress
Advances in Electronic and Photonic Technologies (ADEPT 2021)
20-23.09.2021, Podbanské, Slovakia