iRel40 participation at INFOS 2023 conference
Between the 27th and 30th of June 2023, the INFOS conference was held in Pizzo, Italy. It is a prestigious biennial event that brings together electrical engineers, technologists, materials scientists, device physicists and chemists from Europe and around the world to debate the newest developments, including related reliability aspects, on thin insulating films on semiconductors and identify the challenges ahead in this highly diversifying field.
In this context, an IUNET team (see photo in the middle) has shared the results of the iRel40 project, divulging general information and disseminating the main project outcomes by means of A0 posters and flyers. Several interesting discussions took place, focusing on reliability, from material to system, and on the adoption and support of algorithms based on Artificial Intelligence.
In particular, the following iRel40 contributions have been discussed:
- physics-based models developed and/or adopted for emerging technology simulation;
- fabrication, processing, integration and characterization of advanced materials for smart electronics, such as GaN-on-SOI;
- methods to investigate interface quality in respect to defects and contamination generated;
- test coverage for meeting new and critical reliability requirements, faster assessment and optimized quality and reliability in manufacturing;
- deployment of machine learning based data driven reliability models to minimize reliability risks;
- real-time detection of degradation through AI based and PHM methods and RUL life prediction.
Overall, the common thread has been the project's motto, i.e., "reliability is not everything, but without it everything is nothing".
Keywords:
Dissemination, iRel40, INFOS conference