The scientists at the Fraunhofer Division Engineering of Adaptive Systems EAS work on key technologies for the connected world of tomorrow. Their main focus lies on future-oriented adaptive systems that can recognize, analyze and evaluate changes in their environment or in their inner structure.
The Fraunhofer Institute for Integrated Circuits IIS, headquartered in Erlangen, Germany, conducts world-class research on microelectronic and IT system solutions and services. The scientists in the Division Engineering of Adaptive Systems EAS in Dresden develop innovative algorithms and powerful sensor components, among other things. In addition, the focus of the division is on the design of reliable, robust and secure electronic systems based on state-of-the-art semiconductor technologies.
Further focal points are the automatic analysis of large amounts of data and the development of technologies for networked automation in production processes. Future topics that Fraunhofer IIS/EAS is particularly concerned with are artificial intelligence, IoT, trusted electronics and quantum communication. Tailored to current industrial needs and future challenges, the researchers work on adaptive and robust technological solutions in a broad range of applications such as mobility and industrial automation.
Fraunhofer IIS/EAS contributes its experience as one of the leading research institutes in electronic design automation (EDA) in Europe. Especially, the experience in device degradation effects and their circuit-level modeling, circuit-level aging simulations with their pros and cons, and the implementation of EDA tool add-ons are of great benefit for the iRel40 consortium. Fraunhofer IIS/EAS develops models, methods, and tools that support analog IC and system designers in achieving the reliability requirements from an application perspective and hence to provide a solid base for reliable electronic components and systems in the future.
Fraunhofer IIS/EAS develops and implements an EDA tool add-on that allows an efficient test in IC design for potential reliability issues by quickly outlining cases and scenarios that really have to be investigated further. Making reliability investigations more efficient, the contribution will strengthen the acceptance of reliability investigations during IC design and, therefore, lead to more reliable circuitry and ICs. The tool development is part of the industrial use case DI-4. In addition, Fraunhofer IIS/EAS works on hybrid models by integration of physics-of-failure (PoF) and data-driven approaches in system simulations using compact models.